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Atom Loss during EM Measurements - Practical Electron Microscopy and Database - - An Online Book - |
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| Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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It is very normal that the structure of the measured materials is not damaged during EM measurements, such as TEM, SEM, EELS and EDS. However, atom loss is very common. For instance, some loss of surface oxygen, but not bulk oxygen, happened during high-dose EELS experiments on Li[Mn2]O4. [1]
[1] Charles D. Amos, Manuel A. Roldan, Maria Varela, John B. Goodenough, and Paulo J. Ferreira, Revealing the Reconstructed Surface of Li[Mn2]O4, Nano Lett. 2016, 16, 2899−2906.
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