Electron microscopy
 
EDS Measurement of Silver (Ag)
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        


=================================================================================

 

As discussed on page4650, X-ray absorption is a function of the energy of X-rays. Low energy peaks will be more strongly absorbed than high energies ones. For thick TEM samples, k-factor correction due to X-ray absorption is needed in order to accurately quantify EDS measurements. Table 1316 lists Ag-examples of thicknesses at which the thin-film approximation is no longer valid due to X-ray absorption effects in specific materials.

Table 1316. Examples of limits to the thin-film approximation caused by X-ray absorption: Maximum thicknesses of thin specimens for which the absorption correction (or error) is less than ±10% and ±3%.

Material

10% error in kAB
3% error in kAB
Absorbed X-ray lines
Primary X-ray lines
Thickness (nm)
Ag2Al
33 10 Al Kα and Ag Lα Al Kα (1.486 keV) and Ag Lα (2.984 keV)
Ag3Al
31 9 Al Kα and Ag Lα Al Kα (1.486 keV) and Ag Lα (2.984 keV)

 

 

 

 

=================================================================================