Condenser Stigmators
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 1966 shows the structure of the electron probe-forming system in STEM mode in JEOL JEM-2010F TEMs.

Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs

Figure 1966. Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs.

 

 

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