Depth of Field in EM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Different from the concept of depth of focus, the depth of field (Δu) in an electron microscope (EM) is the range of distance along the optical axis in which the specimen can move without the image appearing to lose the contrast and sharpness. That means, in the range of depth of field, the top and bottom of the specimen are simultaneously in focus. Therefore, the depth of field also limits the maximum thickness of the sample that can be observed by the microscope.

 

 

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