EELS & EFTEM Measurements in Aberration Corrected TEMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Spherical aberration correction in EMs can induce a probe-current-density increase by a factor of 4 to 9. Not only will this enhance the signal-to-noise ratio of STEM images but also the signals for analytical electron microscopy, for instance, energy-dispersive X-ray spectroscopy (EDX) and electron energy-loss spectroscopy (EELS).

 

 

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