EELS Measurement in Diffraction Mode
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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EELS measurement can be done in electron diffraction mode in TEM. In this mode, the beam illumination area can be very large if the material non-uniformity is not an issue. Therefore, carbon contamination and beam damage can be minimized because when the beam is enlarged the beam current density can be very small.

 

 

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