EELS of Gaseous Atoms
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Electron energy-loss spectroscopy (EELS) has been applied to study the excitation of the inner-shell electrons of gaseous atoms [1] and molecules [2-5] with low-energy incident electrons, e.g. at 2.5 keV. At these low energies, the spectra are dipole dominated and are analogous to photoabsorption spectra obtainable with bremsstrahlung or synchrotron radiation. The continuously variable energy loss is similar to a tuneable photon energy. The highest electron energy losses studied in gases have been about 700 eV in the region of F 1s excitation [2,3,6] and about 880 eV in the region of Ne 1s (K-shell) excitation as the extension of inner-shell EELS [7].

 

 

[1] King G C, Tronc M, Read F H and Bradford R C 1977 J. Phys. B: Atom. Molec. Phys. 10 2479.
[2] Hitchcock A P and Brion C E 1978 J. Electron Spectrosc. 13 193.
[3] Hitchcock A P and Brion C E 1978 Chem. Phys. 33 55.
[4] Hitchcock A P and Brion C E 1980 J. Electron Spectrosc. 18 1.
[5] Tronc M, King G C and Read F H 1979 J. Phys. B: Atom. Molec. Phys. 12 137.
[6] Wight G R and Brion C E, 1974 J. Electron Spectrosc. 4 327.
[7] A P Hitchcock, and C E Brion, Neon K-shell excitation studied by electron energy-loss spectroscopy, 1980 J. Phys. B: At. Mol. Phys. 13 3269.

 

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