This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The reductions of crystal- and grain-size result in reciprocal-space broadening of diffraction intensities in x-ray, electron, and neutron diffractions. Scherrer correlated such a broadening with the inverse of the mass-weighted average grain size. [1,2]

[1] P. Debye and P. Scherrer, Nachr. Ges. Wiss. Goettingen, Math.-Phys. Kl. (1916), 1.
[2] A. L. Patterson, Phys. Rev. 56, 978 (1939).