Image Localization in STEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The probe forming aperture in STEM is often compared to the objective aperture in parallel beam illumination in CTEM. The effect of aperture size on the CTF for HAADF STEM imaging is a much more complex issue. The point spread function is proportional to the square of the probe wavefunction and not the wavefunction itself (as in Bright field CTEM). The response to increasing the aperture size is non-linear and affects all spatial frequencies, not just the highest. The phase errors at large angles to the optic axis essentially are mixed in to the lower frequencies, degrading both contrast and image localization.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.