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SEM Resolution Affected by Delocalization of Inelastic Scattering
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The resolution of HR-SEM is affected by the delocalization of inelastic scattering, therefore, this resolution should be improved as the accelerating voltage of the incident electron beam is reduced.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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