This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The environmental requirements for SEMs (scanning electron microscopes) and FIBs (focused ion beams) are not as serious as those for TEMs (transmission electron microscopes). The TEMs need to be placed in custom-built laboratories with special vibration-free foundations, thorough sound shielding, minimized stray magnetic fields, and air temperature that is kept variations within 0.1 °C [1,2]. Even with these precautions, they remain sensitive to occasional disturbances such as pressure changes induced by doors opening and closing, and the low frequency magnetic fields owing to closely passing trucks [2].

The TEM column normally has an overall height of 3 m or more, while the SEM and FIB columns are shorter.

The TEM room should be acoustically quiet. All computers with fans should be moved out of the room because the fans release and move heat around the room.

[1] M.A. O’Keefe, et al., Ultramicroscopy 89 (2001) 215.
[2] D.A. Muller, et al., Ultramicroscopy 106 (2006) 1033.