Intensity/Signal Comparison between STEM and CTEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The signal in STEM images is typically smaller than that in equivalent CTEM images. Therefore, because we need a certain dwell time to collect sufficient signal, we normally take relatively small fields of view in STEM imaging in order to avoid taking an unfeasibly long time for large fields of view.

 

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
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