Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| To form Z-contrast images, the STEM objective aperture must be inserted to cut out high-angle electron rays, and an annular detector must be inserted after the projector lens system. The schematics in Figure 4530 shows the electron optical column in a modern analytical electron microscope operated in STEM mode, indicating the projector lens controlling detector collection angle.
Figure 4530. Schematics of the electron optical column in a modern
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