HAADF Detectors
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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To form Z-contrast images, the STEM objective aperture must be inserted to cut out high-angle electron rays, and an annular detector must be inserted after the projector lens system. The schematics in Figure 4530 shows the electron optical column in a modern analytical electron microscope operated in STEM mode, indicating the projector lens controlling detector collection angle.

Schematics of the electron optical column in a modern analytical electron microscope operated in STEM mode

Figure 4530. Schematics of the electron optical column in a modern
analytical electron microscope operated in STEM mode.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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