Solid Angle of Secondary Electron Detection in SEM
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. The sections and pages with a red star (*) or without stars are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies. If you are citing the contents in the book, for instance, please cite them in the format of “Practical Electron Microscopy and Database, Y. Liao, 2006,  pp 4832” for http://www.globalsino.com/EM/page4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (2006),  http://www.globalsino.com/EM/page4832.html”.

 

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Solid angle of secondary electron detection in SEM can be defined by the angular interval of α from αmin to αmax. Not all emitted SEs are collected by the detectors in SEM and the collection efficiency of the detectors is a function of the solid angle of the detector relative to the successive analyzing locations.

 

 

 

 

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