Dark Current and its Removal in EELS and EFTEM
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



Each EEL spectrum can be corrected for dark current and gain variations between the detector elements of the CCD and for multiple scattering applying Fourier–log deconvolution. The dark current arises from thermally excited current in the detector. For each core-loss edge recorded, dark current spectrum should be collected.



The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

Copyright (C) 2006 GlobalSino, All Rights Reserved