Intensity/Counts of EELS
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The intensity variation in the EELS spectrum depends on the range of electron-scattering angle collected by the spectrometer. Generally speaking, large collection angles will give high intensity but poor energy resolution.


 

 

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