Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Table of Contents/Index

Chapter/Index: A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Introduction

The online book at www.globalsino.com/EM delves into the intricate world of electron microscopy (EM), offering a comprehensive guide to understanding and utilizing this powerful analytical tool in various scientific fields. The book covers a broad range of topics, from the fundamental principles of electron microscopy to advanced techniques used in the characterization of materials at the nanoscale. It provides detailed explanations of different types of electron microscopes, including Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB), and the relevant analytical techniques, and discusses their applications in materials science, integrated circuits (ICs), biology, and nanotechnology.

In addition to the technical aspects, the book also addresses the practical challenges faced by researchers using electron microscopy, such as sample preparation, image interpretation, and the limitations of different EM techniques. It includes a wealth of practical advice, troubleshooting tips, and case studies to help readers gain a deeper understanding of how to effectively use EM in their own research. The book serves as both a reference guide for experienced microscopists and a learning resource for newcomers to the field, making it a valuable tool for anyone interested in the microscopic analysis of materials.

Interaction between incident electrons and matters

Interaction between incident ions and matters
Electron microscopes (EMs) and ion microscopes History of TEM
History of electron microscopies (EMs) Schematic diagram of TEM systems
Schematic diagram of SEM systems Advanced/latest transmission electron microscopes (TEMs)
Techniques in electron microscopes History of EELS technique
Ion beams and their applications Relationship between diffraction group and point group
Techniques for material characterizations and their capabilities Computer-control on electron microscopes
Success of EM experiments Glossary of Terms