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Table of Contents/Index 
Second Edition: Practical Electron Microscopy and Database, Yougui Liao (2006)
Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Chapter Introduction
 
Interaction between incident electrons and matters Interaction between incident ions and matters
Electron microscopes (EMs) and ion microscopes  
History of electron microscopies (EMs) History of TEM
Schematic diagram of SEM systems Schematic diagram of TEM systems
Techniques in electron microscopes Advanced/latest transmission electron microscopes (TEMs)
Ion beams and their applications History of EELS technique
Techniques for material characterizations and their capabilitiess Relationship between diffraction group and point group
Success of EM experiments Computer-control on electron microscopes
 
  Chapter A Chapter B     Chapter C Chapter D
  Chapter E Chapter F   Chapter G Chapter H
  Chapter I Chapter J   Chapter K Chapter L
  Chapter M   Chapter N     Chapter O   Chapter P  
  Chapter Q   Chapter R     Chapter S   Chapter T  
  Chapter U   Chapter V     Chapter W   Chapter X  
  Chapter Y|   Chapter Z     Chapter Appendix   
 
 
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