Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
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C
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D
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E
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F
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G
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H
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I
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J
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K
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L
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M
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N
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O
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P
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Q
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R
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S
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T
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U
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V
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W
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X
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Y
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Z
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Appendix
Chapter F
F-centered lattices/F-centering & their space groups
Orthorhombic
F222 (22)
Fmm2 (42)
Fdd2 (43)
Fmmm (69)
Fddd (70)
Cubic
F23 (196)
Fm-3 (202)
Fd-3 (203)
F432 (209)
F4
1
32 (210)
F4-3m (216)
F-43c (219)
Fm-3m (225)
Fm-3c (226)
Fd-3m (227)
Fd-3c (228)
Others
Fm-35
Face pole (plane normal) in electron stereographic projection
Face-centered orthorhombic structure
Far infrared
Factors limiting imaging and spectroscopy in TEM
Faraday’s law
Faraday cage/cup for probe current measurement in EMs
Failure in materials and devices
Failure modes of light emitting diodes (LEDs) and laser diodes (LDs)
Reasons causing electron filament (gun) failure
Face-centered cubic (fcc) crystal structures
9R structure at grain boundaries in FCC materials
BCC structure at grain boundaries in FCC materials
<110> tilt twin and grain boundaries in FCC materials
HCP structure at grain boundaries in FCC materials
Standard indexed diffraction patterns for fcc crystals
Electron diffraction of face centred cubic (fcc) lattices
fcc-type packing short range ordering of metallic glass
Diffraction comparison between different cubic crystal structures
Examples of indexed electron diffraction patterns of FCC crystals
Determination of Burgers vector of fcc lattice defects
Fans
FeCoN
FEI Corporate
FEI TEMs
Fermi energy of materials
Fermi’s Golden Rule
Fe
2
O
3
(hematite/haematite)
Ferroelectrics & Ferroelectric materials
Analysis techniques for ferroelectric materials
EELS analysis of ferroelectric materials
Ferroelectric & ferroelastic interactions
Properties of ferroelectric crystals
Polar point groups for ferroelectricity
Piezoresponse atomic-force microscopy (PFM)
Perovskite-like ferroelectrics
Classifications of ferroelectric materials
Curie-Weiss temperature in ferroelectrics
History of ferroelectricity
Order–disorder ferroelectrics
Ferroelectric random access memories (FeRAMs/FRAMs)
Comparison between different memories
Displacive ferroelectrics
Ferroelectrics:
Phase transitions inducing ferroelectricity
First-order ferroelectric phase transitions
Second-order phase transitions
Ferroelectrics:
Spontaneous polarization in ferroelectrics
Remanent polarization in ferroelectrics
Direction of spontaneous polarization in ferroelectrics
Angle between polarization vectors of adjacent domains in various crystalline phases in ferroelectrics
Polarization in ferroelectrics measured by CBED in STEM mode
Ferroelectric properties:
Table of characteristics of some specific ferroelectric materials
Dielectric constant of ferroelectric crystals
Ferroelectric dielectric hysteresis & hysteresis loop
Coercive field in ferroelectrics
Curie temperature/Curie point in ferroelectrics
Domain in ferroelectric materials
Strain/stress in ferroelectric materials
Degradation/failure in ferroelectrics
Aging in ferroelectrics
Ferroelectrics:
Major electrical long-term failure mechanisms
Fatigue in ferroelectrics
Retention & retention loss in ferroelectrics
Imprint in ferroelectrics
Ferroelectrics: Physical failure mechanisms
Stability of ferroelectrics related to oxygen vacancies
Ferromagnetics and ferromagnetic materials
Curie temperature/Curie point in ferromagnetics
Fibers
Infrared optical fibers
Fiber/biprism filament in Möllenstedt–Düker biprism for off-axis electron holography
Field Effect Transistor (FET) preamplifier in EDS systems
Field astigmatism in EMs
Fifth-order aberration correction
Fifth-order 6-fold astigmatism & its corrections
Five (5)-fold rotational symmetry
Field lines
Magnetic field lines
Field of view
Aberrations and imaging requirements for small field of view in EMs
Aberrations and imaging requirements for large field of view in EMs
Off-axial coma and field of view
TEM specimen traverse induced by specimen tilting
Filaments in EMs
LaB
6
filament
Field-emission gun
Comparison between different electron sources/guns
Comparison between EFG(field emission)-TEMs and CTEMs (LaB
6
and tungsten)
Future developments and possibilities of field emission guns
Filters & fitting techniques
Energy filters to improve energy spread in EMs and EELS
Filters (devices)
Fourier filtering/masking
Digital-filtered least-squares peak fitting for EDS quantification
Linear least squares fitting technique
Filter kernels in image processing
Prewitt edge filter (operator)
Sobel edge filter (operator)
Top-hat filtering and bottom-hat filtering
Top-hat filter for EELS
Fine probe/beam formation in EMs
Fine structure of ionization edges in EELS
Effect of chromatic aberration on fine structure analysis using EFTEM
Finish-start/right-hand (FS/RH) convention & Burgers circuit
Firewire (Peripheral Component Interconnect) PCI card
First order Laue zones (FOLZ)
Standard FOLZ diffraction patterns for various crystal structures
Shift of HOLZ patterns relative to ZOLZ patterns
Fingerprint related contamination in EMs
First Bethe approximation/two-beam conditions in TEM measurements
First-order Born approximation/Born series
First-order ferroelectric phase transitions
Flashing electron guns
First-order phase transitions
Fluctuation microscopy
Fluorescence
Secondary X-ray (Fluorescence) in EDS measurements
Viewing screen/fluorescent screen in EMs
Fluorine
EDS measurement of fluorine (F)
EELS measurement of fluorine (F)
XPS of fluorine and its related materials
Fluorine contamination in IC chips
Fluorides
CF
4
gas
Calcium fluoride (CaF
2
)
Ammonium fluorosilicate [(NH
4
)
2
SiF
6
]
XeF
2
Flyback time: set flyback time in DigiScan image to avoid image distortion
Focal series of TEM images
Focal length of magnetic lenses
Focal length of objective lens
Focal point in electromagnetic lenses
Focus
Difference of focus depth for inelastic (core-loss EFTEM) and elastic imaging
Focused convergent incident electron beam
Marginal ray focus
Paraxial ray focus
Depth of focus in EM
Focusing properties of electromagnetic lenses affected by aberrations
Aberration correction through-focus series reconstruction
Line focus in EMs
Cross-over formed by focusing electron beam
FIB lithography
Focusing & Defocusing in EMs
Focused ion beam (FIB) systems
Introduction of lens/real lens in EMs and FIBs
Dual beam FIB/SEM
Companies/manufacturers producing FIB instruments
Models of FIB systems
Examples of FIB specifications
Cryo-focused ion beam (FIB)
Ion extractor in FIB
Ion channeling on FIB measurements
Beam suppressor in FIB
Resolution of FIB milling
Lateral ranges of probe ions in FIB and SIMS
Beam current of FIB
Ion irradiation dose
Spray & beam defining apertures in FIB
Beam blanking deflector in EMs and FIB
Octopole and other lenses in FIB
Working distance in FIB processes
Sample stage in FIB systems
Comparison between FIB, electron beam and laser beam techniques
FIB: Ion sources for FIB
Liquid-metal ion source (LMIS)
Gallium source in dual beam FIB/SEM & single beam FIB
Alloy liquid metal ion sources for advanced FIBs
Properties of accelerated charged particles
FIB process and its applications
Passive voltage contrast (PVC) in FIB and SEM
Active voltage contrast (AVC) in FIB and SEM
Positive charging case of PVC in FIB and SEM
Voltage contrast in FIB and SEM
Smallest structures obtained by dual beam SEM/FIB/STEM deposition
Gas-assisted etching in FIB milling
FIB induced deposition
Charging enhanced electron/ion-beam-induced-deposition
Sample charging in FIB processes
Secondary electron emission by ion irradiation
Redeposition of sputtered atoms in FIB
Grain size/boundary determination by FIB
Tomographic properties of SEM and dual-beam techniques
FIB ionic sputtering
Introduction and theory of ionic sputtering yields (in FIB & SIMS)
Table of ionic sputtering yields and rates in FIB & SIMS
Introduction and theory of milling rate of materials in FIB
Angular dependence of milling in FIB
Time-efficiency/speed of FIB milling
Ionic sputter yield depending on grain orientation
Penetration depth/implant depth/trajectory of ions in FIB milling
Vacancy & interstitial generation in FIB milling
Polymer TEM sample preparation
FIB-irradiation-induced bending
Stress-redistribution-induced film bending due to FIB irradiation
Thermo-plastic expansion induced film bending due to FIB irradiation
Focused ion beam:
TEM sample preparation by FIB
Advantages and disadvantages of FIB technology for EM sample preparations
Mounting of TEM grid in grid-holder of FIB system
Conventional cross-section FIB TEM specimen preparation method
“Lift-out” FIB-TEM specimen preparation technique
Wedge FIB milling method for TEM specimen preparation
Examples of experimental conditions for FIB specimen preparation
Ultra-thin TEM specimens prepared by FIB milling
Point defects created in FIB-EM sample preparation
Rippling effect in FIB-EM sample preparation
Curtaining effect in FIB-EM sample preparation
Comparison between FIB and Ar (argon) ion milling specimen preparations
Focused ion beam (FIB):
Ion-beam induced structural change/damage at surfaces
Preferential destruction of multilayers in FIB milling
Amorphous layer formed during EM sample preparation using FIB
Plasma cleaning of FIB prepared specimens
Double cross-sections for examing damage of prepared EM sample surface
Dopant deactivation induced by FIB sample preparation
Gallium contamination due to FIB milling & in FIB deposits
Specimen quality depending on sample tilting in FIB
Melting/temperature rise of materials in FIB processes
TEM lattice fringe affected by FIB damage
Amorphization of materials due to FIB deposition
"Mottling" visible in FIB and Ar-milled specimens
Sidewall implantation in TEM sample preparation with FIB
Folding/convolution of functions
Forbidden reflections/diffraction spots in diffraction patterns
Gjönnes-Moodie extinctions in electron diffraction patterns
Existing of extinction bands within forbiddden reflections in CBED patterns
Extinctions and weak spots showing in electron diffraction patterns of diamond, silicon, germanium, and Tin (Sn)
Double/multiple diffraction in electron diffraction patterns
Formation
TEM image formation process
Four-fold
Four-fold astigmatism & its measurement and correction
Four-fold rotational symmetry & its axis in crystals
Fourier:
Discrete/continuous/fast Fourier transform (DFT/CFT/FFT)
Fourier (transform/transformation) lens
Additional spots due to inadequate gain normalization (in diffractograms obtained by Fourier transformation)
Relationship between lens & Fourier transformation
Uneven illumination effect on Fourier transform in TEM
Fourier filtering/masking
Astigmatism effect on Fourier transform
Relationship between electron diffraction & image and Fourier transform
Fourier coefficients of electrostatic potential
Fourier transform of EEL spectra and images
Streaking artefacts in FFTs of TEM images
Fourier deconvolution techniques for EELS/EFTEM
Fourier-log method for EELS deconvolution
Fourier-ratio method for EELS deconvolution
Fourier transform:
Fourier transform & Phase of Fourier components in HRTEM images
Accuracy of lattice spacing measurements by HRTEM/FFT/electron diffraction
Fourier transform and FFT of HRTEM image of crystalline materials
Fourier transform and FFT of HRTEM image of amorphous materials
Accuracy of angle measurement in HRTEM and FFT images
Fraction
Fraction of absorbed electrons depending on sample thickness
Fraction of transmitted electrons depending on sample thickness
Fraction of backscattered electrons depending on sample thickness
Fraction of electrons scattered onto an ADF detector
Dependence of crystallized fraction on annealing time and temperature
Frank’s rule in dislocation theory
Fraunhofer diffraction
Frenkel pair
Free-electron and interband transition metals
Free-electron metals
Free energy (Gibbs)
Fowler-Nordheim (F-N) distribution
Free volume in metallic glasses
Free volume determination in metallic glasses
Coordination number dependence on free volume in metallic glass
Free volume change of metallic glasses at elevated temperatures
Analysis of free volume of amorphous materials using electron diffraction
Free volume change in amorphous materials induced by deformation
Freon and its application in EMs
Fresnel fringes in TEM images
Defocus Affecting Fresnel fringes
Factors affecting Fresnel fringes
TEM contrast/fringes at interface between two materials
Spatial resolution affected by objective astigmatism
Overfocus in EMs
Underfocus in EMs
Fresnel fringes affected by objective astigmatism and its correction
Dependence of Fresnel fringes on TEM specimen thickness
Beam divergence effects on Fresnel fringes
Crossed lattice fringes to form HRTEM images
Friedel (or Bijvoet) pair & Friedel's law
Departure from Friedel’s law in CBED patterns
Fringes
Fringe spacing in electron holography
Pendellösung fringes in crystals
Kossel-Möllenstedt (K-M) fringes
Lattice-fringe/structural fingerprinting
Lattice-fringe visibility & its band & band broadening
Lattice-fringe visibility maps
TEM lattice fringe affected by FIB damage
Front focal plane of objective lens
Fuel Cells
Solid oxide fuel cells (SOFC)
Full-frame transfer (FT) CCD
Funnels used to fill cold traps with liquid nitrogen for EMs
Full width at half maximum (FWHM) of emitted SE distribution
Full width at half maximum (FWHM) of X-ray diffraction lines
Functions in Gatan digital micrograph