Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
|
Appendix
Chapter G
Gabor defocus
Gabor’s (in-line) holography
Gadolinium
Gadolinium doped ceria oxide (GDC)
Gain
Gain variations in GIF, CCDs & EELS channels
Additional spots due to inadequate gain normalization (in diffractograms obtained by Fourier transformation)
Gain normalization for EELS measurement
Gallium (Ga)
EDS measurements of gallium
EELS of gallium (Ga)
AlGaInP
AlGaAs
ZnSSe-based/GaAs heterostructures
GaN
GaP
GaAs
Compound semiconductor
Gallium contamination due to FIB milling & in FIB deposits
Gallium source in dual beam FIB/SEM & single beam FIB
Ga ionic sputter yield in Ga-based FIB & SIMS
Fraction of backscattered Ga ion in FIB milling and SIMS measurement
Gamma rays
Garnets
Ce-doped Yttrium-Aluminum Garnet (YAG)
Gas
EELS of gaseous atoms and molecules
Gas-assisted etching in FIB milling
Gaskets in EMs
Gatan software
Introduction of digital micrograph
Gatan Imaging Filter (GIF) software package
GIF mapping module in Digital Micrograph
Gatan FireWire adapter (GFA) (DigiScan/Compliant/Legacy ) software/hardware
Tags on Gatan Digital Micrograph
Sharpen filter
Line Annotation with and without Length label on DM
Arrow annotation on DM
Double arrow annotation on Gatan DigitalMicrograph
Box (rectangle) annotation on Gatan DigitalMicrograph
Oval annotation on Gatan DigitalMicrograph
Spot mask annotation on Gatan DigitalMicrograph
Array mask annotation on Gatan DigitalMicrograph
Profile function on Gatan DigitalMicrograph
Text annotation on Gatan DigitalMicrograph
Bandpass mask annotation on Gatan DigitalMicrograph
Wedge mask annotation on Gatan DigitalMicrograph
Rectangle ROI on Gatan DigitalMicrograph
Line ROI on Gatan DigitalMicrograph
Point ROI on Gatan DigitalMicrograph
Oval ROI on Gatan DigitalMicrograph
Loop ROI and Curve ROI on Gatan DigitalMicrograph
Gatan Orius SC200D CCD camera
Gatan Digital Micrograph Scripts
Gatan Imaging Filter (GIF) software package
Functions in Gatan digital micrograph
Reinstallation of Gatan DM on PC connected with TEM system
Scripts of input dialogs and popup windows for DM
TagGroup
Gatan hardware
Gatan/GIF cameras
Shutters in TEM system
Entrance aperture in GIF camera
Slits in EELS spectrometer and GIF camera
Retractable TV-rate camera
Drift tube in GIF system
Quadrupole lens application in GIF system
Octupole lens application in GIF system
Sextupole lens application in GIF/EELS systems
Hole mask/entrance mask in GIF system
Scanning coils in EELS/GIF systems
DigiScan software and hardware
Gatan PIPS (Precision Ion Polishing System)
Gatan Instrumentation Bin (GIB)
No GIF images/spectra
GIF controllers
Contamination of GIF system
GIF gate valve
Pressurized air for EM parts
Pneumatic apertures
Water cooling in EMs
Vacuum of GIF camera chamber
Vacuum of GIF camera chamber
EEL spectra/image shift on camera caused by magnetic objects
Instability of EEL spectra or images due to GIF charging
Gatan MultiScan camera complete KIT
Gatan Bioscan Camera
Gatan hardware and software troubleshooting
Troubleshooting related to GIF software and hardware
Troubleshooting related to DigiScan
Cathodoluminescence system and their troubleshooting
Gate in MOS
Gate in Transistors
Leakage current in gate oxide of MOS
PVC (passive voltage contrast) of gate contacts
Physical gate length
Problems in poly-Si gate in ICs
Gata:
Metal gate
Gate oxides
Metal oxides
Thermodynamic stability of metal gate oxides in ICs
Gauge
Pirani gauge
Penning gauge
Gaudefroyite (Ca
4
Mn
3+
2.5
(BO
3
)
3
(CO
3
)O
2.25
(OH)
0.75
)
Gauss' law for magnetism
Gauss' law for electricity
Gaussian optics in EMs
Gaussian distribution
Deviation of Gaussian distribution of defocus due to chromatic aberration
Gaussian distribution of electron beam intensity/probe tail
Distortion/asymmetry of X-ray peak from Gaussian shape in EDS
Shape of X-ray peak in EDS measurements
Gaussian Focus
Minimum (phase-)contrast in (HR)TEM imaging with Gaussian defocus
Gaussian Focus for Core-Loss EFTEM Imaging
Ronchigram at Gaussian focus
Generation
Generation of defects in Crystals
Geometric aberration
EELS energy resolution limited by geometric aberration
Geometric-aberration free: ideal (first-order) trajectories of electrons
Germanium (Ge)
EDS measurement of germanium
EELS measurement of germanium
Phase diagram of germanium-X
Extinctions and weak spots showing in electron diffraction patterns of germanium
Comparison of various X-ray spectrometers
Lithium drifted & intrinsic germanium EDS detectors
Solid solubility of various impurities in germanium
Ge
x
Sb
y
Te
z
(GST)
Ge-based metallic-glass alloys
SiGe/Si system and its defects
Gibbs free energy
Gibbs free energy change due to alloy formation
“Ghost Feature” in 2-D diffractograms
Gjönnes-Moodie (G-M) extinctions/lines in electron diffraction patterns
Glaser’s “Glockenfeld” (bell-shaped field) in EMs
Glide/slip planes and glide/slip directions
Glass
Cooling rate to make metallic glasses from melts
Glass transition of metallic glasses
Glass forming ability (GFA) from melts
Reduced glass transition temperature
Critical casting thickness for formation of metallic glass alloys from melts
Glide dislocation
Glide and dislocation loops
Gold (Au)
EELS measurement of gold (Au)
EDS measurement of gold (Au)
HRTEM and diffraction of gold (Au) particles & single crystals
Special application of gold in EM-related devices
Gold in ICs
Phase diagram of gold-X
Gold nanoparticles
Au-based metallic-glass alloys
Adhesion between gold and other materials
Golden mean/golden ratio and quasicrystals
Goldschmidt tolerance factor
Goniometer stages in TEMs
Grain boundary dissociation and Interfacial reconstruction in polycrystals
9R structure at grain boundaries in FCC materials
BCC structure at grain boundaries in FCC materials
HCP structure at grain boundaries in FCC materials
EELS analysis of grain boundaries
Grain boundary measurements with EBSD
Grain boundary in polycrystalline materials
Crystalline structure of "perfect" grain boundary
Energy of atoms at grain boundaries
<110> tilt twin and grain boundaries in FCC materials
Σ3 grain and twin boundaries in FCC materials
Σ11 grain and twin boundaries in FCC materials
Σ43 grain and twin boundaries in FCC materials
Σ99 grain and twin boundaries in FCC materials
Preferential electron-beam etching of grain boundaries
Diffusion/penetration/diffusivity of elements through grain boundaries
Preferential ion milling at grain boundaries
Grain-boundary grooving mechanism/model
Grain boundary diffusion mechanism of electromigration in interconnects in ICs
Grain boundary strength
Effect of grain boundary on electrical properties
Dangling-bonds in grain boundaries
Measurement of elemental segregation at grain boundaries
Grain growth
Grain growth induced by FIB milling
Crystal growth
Grain orientation
Ionic sputter yield depending on grain orientation
Evaluation of grain orientations based on electron backscattering
Evaluation of grain orientation based on Kikuchi lines/bands
Different TEM techniques for crystalline grains in various sizes
Orientation relationship between two crystals/grains
Grain size
Evaluation of grain size by XRD technique
Grain size dependence of electromigration-induced failures
Grain size/boundary determination by FIB
Broadening of diffraction intensities depending on grain size
Graphene
Analysis of graphene using EMs
Graphite
Graphite as negative electrodes in lithium batteries
Grazing incidence optics
Great circles in Wulff Net
Grease of vacuum seals
Green’s function
Grids
TEM specimen grids for EDS analysis
Groove edges
Gun lens in EMs
Ground-state energy of inner-shell electron
Gun-alignment and its coil control system/gun shift and tilt in EMs
Group theory
Gun axis in EMs