Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Hafnium (Hf)
EELS measurement of hafnium			EDS measurement of hafnium
HfO₂/HfO_x			HfSiO₄
Hf-X phase diagrams

Halite/rock salt			Halo feature in electron diffraction patterns
Halogens
Halogens in Periodic table & halogen gases
Hard
Hard X-rays			Hard collision between charged particle and atom

Hartree-Slater model for electron excitation modeling & EELS			HD 2700C electron microscope
Heat
Heat generation/temperature rise by irradiation of electron beams			Heating versus phonons formed in EMs
TEM/STEM heating holders			Heat capacity and specific heat of materials
Heavy elements
Contrast difference between heavy and light elements			EDS quantification of heavy elements

Helical trajectory/image rotation & inversion in magnetic fields			Energy-loss mechanisms in a head-on collision between an incident electron and nucleus
Helium (He)
HeIM or SHIM (scanning helium ion microscopy)			EELS Measurement of Helium (He)
TEM observation of helium			Helium (He) sputtering

Hematite/haematite (Fe₂O₃)			Hermann-Mauguin/international notations for symmetry elements
Heterostructures
ZnSSe-based/GaAs heterostructures
Hexagonal crystal systems/HCP (hexagonal close-packed structure; α-phase)
Relationship between the hexagonal and primitive rhombohedral unit cells			HRTEM imaging and electron diffraction of hexagonal symmetry
Tables of Burgers vectors of defects in hexagonal structures			Comparison between hexagonal and C54
Comparison between hexagonal and tetragonal (or orthorhombic) cells
Hexagonal wurtzite structure			Two-dimensional hexagonal atomic sheet
HCP structure at grain boundaries in FCC materials			Standard indexed diffraction patterns for hcp crystals
Indexing of trigonal and hexagonal systems			Examples of indexed electron diffraction patterns of HCP crystals
6 point group			-6 point group
6/m point group			622 point group
6mm point group			-62m point group
6/mmm point group			c/a ratios in hcp structures
Hexagonal space groups
P (primitive) lattices & their space groups
P6 (168)			P6₁ (169)
P6₅ (170)			P6₂ (171)
P6₄ (172)			P6₃ (173)
P-6 (174)			P6/m (175)
P6₃/m (176)			P622 (177)
P6₁22 (178)			P6₅22 (179)
P6₂22 (180)			P6₄22 (181)
P6₃22 (182)			P6mm (183)
P6cc (184)			P6₃cm (185)
P6₃mc (186)			P-6m2 (187)
P-6c2 (188)			P-62m (189)
P-62c (190)			P6/mmm
P6/mcc (192)			P6₃/mcm (193)
P6₃/mmc (194)			P6m2
Hexapole/Sextupole
Hexapole/sextupole/double-hexapole design for C_s corrector in EMs			Hexapole for chromatic aberration (C_c) corrections
Hexapole/sextupole lens application in GIF system
High
Detection of high energy X-rays in EDS			High pressure freezing (HPF) for TEM sample preparation
Pumps for high and ultra-high vacuums			High contrast aperture in TEMs
Comparison of EDS measurements with low- & high-energy incident electrons			High entropy alloys (HEAs)
High angle
High angle elastic scattering of electrons			High angle elastic scattering of ions
Electrons emitted at low & high angles from electron guns			High-angle electron scattering in EMs
High-angle annular dark- field (HAADF) imaging
HAADF detectors			Contrast analysis of HAADF-STEM images
Atomic number (Z)-contrast Imaging on STEM			Incoherence in HAADF imaging
Rutherford (elastic) scattering & HAADF			Thermal diffuse (quasi-elastically) scattering (TDS)
Aberration correction for HAADF imaging			Thickness requirements of TEM samples for HAADF STEM
Sample requirements for high resolution atomic-number contrast HAADF imaging			Electron channeling in HAADF STEM imaging
Simulation of HAADF-STEM images			Determination of specimen thickness by HAADF-STEM
HAADF-STEM images of amorphous metallic glasses			Thermal-diffuse-scattering in in-situ heating HAADF-STEM
Comparison between HRTEM and HR-HAADF-STEM imaging
High-k dielectric materials/oxides
EELS analysis of high-k dielectric materials

High power devices (of ICs)
High order laue zone (HOLZ) in TEM diffraction
Shift of HOLZ patterns relative to ZOLZ patterns			Higher order Laue zones (HOLZ) lines in CBED
Indexing HOLZ patterns			Radius of HOLZ rings
Splitting of HOLZ lines in CBED patterns
High-resolution in EMs
High-resolution EELS (HREELS)			Advanced/atomic/high resolution/latest SEMs
HRSEM/high resolution SEM imaging			HRSTEM/high resolution STEM imaging
High Resolution TEM (HRTEM) and its improvement
Minimum (phase-)contrast in (HR)TEM imaging with Gaussian defocus			Maximum (phase-)contrast in (HR)TEM imaging (with Scherzer defocus)
Electron beam coherence vs HRTEM			Comparison between HRTEM and HR-HAADF-STEM imaging
Intensity distribution of HRTEM image			Performance criteria in HRTEM
Information limit in HRTEM			Thon rings in bright-filed imaging
Best defocus condition for HRTEM imaging			Structure factor and HRTEM
Phase of Fourier components in HRTEM images			Amplitudes of HRTEM image
Fourier transform and FFT of HRTEM image of crystalline materials			Fourier transform and FFT of HRTEM image of amorphous materials
Objective aperture for HRTEM imaging			Aberrations and imaging requirements for small field of view in EMs
High resolution TEM imaging dependence on unit cell size			HRTEM imaging of cubic structures
HRTEM imaging of hexagonal symmetry			HRTEM imaging of perovskite structures
HRTEM images of atomic short-range ordering in crystals			Phase extension procedure
HRTEM and electron diffraction of crystals with trigonal symmetry			HRTEM imags of orthorhombic crystalline structures
Accuracy of angle measurement in HRTEM and FFT images			HRTEM images & electron diffraction of amorphous metallic glasses
Accuracy of lattice spacing measurements by HRTEM/FFT/electron diffraction			Crossed lattice fringes to form HRTEM images
HRTEM analysis of light elements			Comparisons between HRTEM and EELS techniques
Determination of crystal structures using HRTEM technique
High-Resolution TEM (HRTEM) identification of defects in materials
BCC structure at grain boundaries in FCC materials			Chevron Defect
High voltage
Accelerating voltage/tube in EMs
Advantages and disadvantages of low-/high-voltage TEM & STEM			Electron-gun high-voltage power supply in EMs
High voltage fluctuation/stability in microscopes			Ultrahigh voltage TEMs
Wobbler for high tension in TEM/STEM			High tension offset for image filtering for elemental analysis
History
Development history of silicon drift detectors			History of electron microscopies (EMs)
History of TEM			Development history of SEM technique
History of EBSD development			History of EELS technique
			Development history of X-ray analysis for EMs
History of In Situ/environmental TEM/STEM observations			Development history of silicon drift detectors

Highlight bright features in EM images
Hitachi Advanced Research Laboratory & Its EMs			Hilbert-type phase plates for TEMs
Holders/Stages
TEM/STEM specimen holders			Side-entry goniometer stages/holders in TEMs/STEMs
Top-entry goniometer stages/holders in TEMs/STEMs			Damage of TEM specimen holder
Mounting of TEM grid in grid-holder of FIB system			STM holders for EMs
EDS-TEM specimen holders			Sample stage in FIB systems
Vacuum at EM stages
TEM/STEM holders for in-situ synthesis and characterizations
TEM holders for in-situ chemical processes			Liquid/gas TEM and STEM stage and holder
TEM/STEM holders for in-situ electrical biasing			TEM/STEM holders for in-situ nano-indentation analysis
TEM/STEM holders for strain analysis			Piezo drive TEM/STEM holders
TEM/STEM cooling holders			TEM/STEM heating holders

“Hole Count” in X-ray measurements			Hole/bubble/void in materials
Hole mask in Gatan system			(Holey) carbon supports for EM analysis
Holography
Gabor’s (in-line) holography			Digital holography
Holography: Electron holography
In-line electron holography			Requirements to form electron hologram
Fringe spacing in electron holography			Procedure to produce electron holography images
Spatial resolution of electron holography			Gabor defocus
Theory for simulating and reconstructing electron holograms			Unique measurements by holography
Artifacts in electron holography measurements			Spatial coherence/incoherence in EMs
Dopant deactivation induced by FIB sample preparation			TEM sample thickness determination by electron holography
Electron holography study of nanoparticles			Strain analysis using electron holography
Optimization of specimen thickness for electron holography analysis			Comparison between CBED and electron holography
Holography: Off-axis electron holography
Experiments and analysis of off-axis electron holography			Aberration correction using off-axis electron holography technique
Measurement of electric field/dopant/p-n junction using off-axis electron holography			Measurement of magnetic field using off-axis electron holography
Fiber in Möllenstedt–Düker biprisms for off-axis electron holography			Reconstruction of off-axis holograms
Artifacts in off-axis electron holograms: distortions			Interference width in off-axis hologram
Voltage at biprism filament in off-axis electron holography			Deflection angle in off-axis electron holography
Lorentz lens/mode for TEMs

Holohedral point groups			Hough transform
Hume-Rothery (HR) compounds			Hybrid EMs
Hybridization
sp³ hybridization			sp² hybridization
Hydrocarbon (HC)
Hydrocarbon (HC) & carbon contamination of EM specimens

Hydrofluoric acid (HF) etching
Hydrogen (H & H₂)
EELS Measurements of hydrogen (H)			HCl
Hydrogen bonding-type substances

Hydrogenic model for electron excitation modeling
Hysteresis
Ferroelectric dielectric hysteresis & hysteresis loop			Hysteresis factor in electron microscopes
Hysteresis removal in electron microscopes