Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
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Appendix
Chapter H
Hafnium (Hf)
EELS measurement of hafnium
EDS measurement of hafnium
HfO
2
/HfO
x
HfSiO
4
Hf-X phase diagrams
Halite/rock salt
Halo feature in electron diffraction patterns
Halogens
Halogens in Periodic table & halogen gases
Hard
Hard X-rays
Hard collision between charged particle and atom
Hartree-Slater model for electron excitation modeling & EELS
HD 2700C electron microscope
Heat
Heat generation/temperature rise by irradiation of electron beams
Heating versus phonons formed in EMs
TEM/STEM heating holders
Heat capacity and specific heat of materials
Heavy elements
Contrast difference between heavy and light elements
EDS quantification of heavy elements
Helical trajectory/image rotation & inversion in magnetic fields
Helium (He)
HeIM or SHIM (scanning helium ion microscopy)
EELS Measurement of Helium (He)
TEM observation of helium
Helium (He) sputtering
Hematite/haematite (Fe
2
O
3
)
Hermann-Mauguin/international notations for symmetry elements
Heterostructures
ZnSSe-based/GaAs heterostructures
Hexagonal crystal systems/HCP (hexagonal close-packed structure; α-phase)
Relationship between the hexagonal and primitive rhombohedral unit cells
HRTEM imaging and electron diffraction of hexagonal symmetry
Tables of Burgers vectors of defects in hexagonal structures
Comparison between hexagonal and C54
Comparison between hexagonal and tetragonal (or orthorhombic) cells
Hexagonal wurtzite structure
Two-dimensional hexagonal atomic sheet
HCP structure at grain boundaries in FCC materials
Standard indexed diffraction patterns for hcp crystals
Indexing of trigonal and hexagonal systems
Examples of indexed electron diffraction patterns of HCP crystals
6 point group
-6 point group
6/m point group
622 point group
6mm point group
-62m point group
6/mmm point group
c/a ratios in hcp structures
Hexagonal space groups
P (primitive) lattices & their space groups
P6 (168)
P6
1
(169)
P6
5
(170)
P6
2
(171)
P6
4
(172)
P6
3
(173)
P-6 (174)
P6/m (175)
P6
3
/m (176)
P622 (177)
P6
1
22 (178)
P6
5
22 (179)
P6
2
22 (180)
P6
4
22 (181)
P6
3
22 (182)
P6mm (183)
P6cc (184)
P6
3
cm (185)
P6
3
mc (186)
P-6m2 (187)
P-6c2 (188)
P-62m (189)
P-62c (190)
P6/mmm
P6/mcc (192)
P6
3
/mcm (193)
P6
3
/mmc (194)
P6m2
Hexapole/Sextupole
Hexapole/sextupole/double-hexapole design for C
s
corrector in EMs
Hexapole for chromatic aberration (C
c
) corrections
Hexapole/sextupole lens application in GIF system
High
Detection of high energy X-rays in EDS
High pressure freezing (HPF) for TEM sample preparation
Pumps for high and ultra-high vacuums
High contrast aperture in TEMs
Comparison of EDS measurements with low- & high-energy incident electrons
High angle
High angle elastic scattering of electrons
High angle elastic scattering of ions
Electrons emitted at low & high angles from electron guns
High-angle electron scattering in EMs
High-angle annular dark- field (HAADF) imaging
HAADF detectors
Contrast analysis of HAADF-STEM images
Atomic number (Z)-contrast Imaging on STEM
Incoherence in HAADF imaging
Rutherford (elastic) scattering & HAADF
Thermal diffuse (quasi-elastically) scattering (TDS)
Aberration correction for HAADF imaging
Thickness requirements of TEM samples for HAADF STEM
Sample requirements for high resolution atomic-number contrast HAADF imaging
Electron channeling in HAADF STEM imaging
Simulation of HAADF-STEM images
Determination of specimen thickness by HAADF-STEM
HAADF-STEM images of amorphous metallic glasses
Thermal-diffuse-scattering in in-situ heating HAADF-STEM
Comparison between HRTEM and HR-HAADF-STEM imaging
High-k dielectric materials/oxides
EELS analysis of high-k dielectric materials
High power devices (of ICs)
High order laue zone (HOLZ) in TEM diffraction
Shift of HOLZ patterns relative to ZOLZ patterns
Higher order Laue zones (HOLZ) lines in CBED
Indexing HOLZ patterns
Radius of HOLZ rings
Splitting of HOLZ lines in CBED patterns
High-resolution in EMs
High-resolution EELS (HREELS)
Advanced/atomic/high resolution/latest SEMs
HRSEM/high resolution SEM imaging
HRSTEM/high resolution STEM imaging
High Resolution TEM (HRTEM) and its improvement
Minimum (phase-)contrast in (HR)TEM imaging with Gaussian defocus
Maximum (phase-)contrast in (HR)TEM imaging (with Scherzer defocus)
Electron beam coherence vs HRTEM
Comparison between HRTEM and HR-HAADF-STEM imaging
Intensity distribution of HRTEM image
Performance criteria in HRTEM
Information limit in HRTEM
Thon rings in bright-filed imaging
Best defocus condition for HRTEM imaging
Structure factor and HRTEM
Phase of Fourier components in HRTEM images
Amplitudes of HRTEM image
Fourier transform and FFT of HRTEM image of crystalline materials
Fourier transform and FFT of HRTEM image of amorphous materials
Objective aperture for HRTEM imaging
Aberrations and imaging requirements for small field of view in EMs
High resolution TEM imaging dependence on unit cell size
HRTEM imaging of cubic structures
HRTEM imaging of hexagonal symmetry
HRTEM imaging of perovskite structures
HRTEM images of atomic short-range ordering in crystals
Phase extension procedure
HRTEM and electron diffraction of crystals with trigonal symmetry
HRTEM imags of orthorhombic crystalline structures
Accuracy of angle measurement in HRTEM and FFT images
HRTEM images & electron diffraction of amorphous metallic glasses
Accuracy of lattice spacing measurements by HRTEM/FFT/electron diffraction
Crossed lattice fringes to form HRTEM images
HRTEM analysis of light elements
Comparisons between HRTEM and EELS techniques
Determination of crystal structures using HRTEM technique
High-Resolution TEM (HRTEM) identification of defects in materials
BCC structure at grain boundaries in FCC materials
Chevron Defect
High voltage
Accelerating voltage/tube in EMs
Advantages and disadvantages of low-/high-voltage TEM & STEM
Electron-gun high-voltage power supply in EMs
High voltage fluctuation/stability in microscopes
Ultrahigh voltage TEMs
Wobbler for high tension in TEM/STEM
High tension offset for image filtering for elemental analysis
History
Development history of silicon drift detectors
History of electron microscopies (EMs)
History of TEM
Development history of SEM technique
History of EBSD development
History of EELS technique
Development history of X-ray analysis for EMs
History of In Situ/environmental TEM/STEM observations
Development history of silicon drift detectors
Highlight bright features in EM images
Hitachi Advanced Research Laboratory & Its EMs
Hilbert-type phase plates for TEMs
Holders/Stages
TEM/STEM specimen holders
Side-entry goniometer stages/holders in TEMs/STEMs
Top-entry goniometer stages/holders in TEMs/STEMs
Damage of TEM specimen holder
Mounting of TEM grid in grid-holder of FIB system
STM holders for EMs
EDS-TEM specimen holders
Sample stage in FIB systems
Vacuum at EM stages
TEM/STEM holders for in-situ synthesis and characterizations
TEM holders for in-situ chemical processes
Liquid/gas TEM and STEM stage and holder
TEM/STEM holders for in-situ electrical biasing
TEM/STEM holders for in-situ nano-indentation analysis
TEM/STEM holders for strain analysis
Piezo drive TEM/STEM holders
TEM/STEM cooling holders
TEM/STEM heating holders
“Hole Count” in X-ray measurements
Hole/bubble/void in materials
Hole mask in Gatan system
(Holey) carbon supports for EM analysis
Holography
Gabor’s (in-line) holography
Digital holography
Holography:
Electron holography
In-line electron holography
Requirements to form electron hologram
Fringe spacing in electron holography
Procedure to produce electron holography images
Spatial resolution of electron holography
Gabor defocus
Theory for simulating and reconstructing electron holograms
Unique measurements by holography
Artifacts in electron holography measurements
Spatial coherence/incoherence in EMs
Dopant deactivation induced by FIB sample preparation
TEM sample thickness determination by electron holography
Electron holography study of nanoparticles
Strain analysis using electron holography
Optimization of specimen thickness for electron holography analysis
Comparison between CBED and electron holography
Holography:
Off-axis electron holography
Experiments and analysis of off-axis electron holography
Aberration correction using off-axis electron holography technique
Measurement of electric field/dopant/p-n junction using off-axis electron holography
Measurement of magnetic field using off-axis electron holography
Fiber in Möllenstedt–Düker biprisms for off-axis electron holography
Reconstruction of off-axis holograms
Artifacts in off-axis electron holograms: distortions
Interference width in off-axis hologram
Voltage at biprism filament in off-axis electron holography
Deflection angle in off-axis electron holography
Lorentz lens/mode for TEMs
Holohedral point groups
Hough transform
Hume-Rothery (HR) compounds
Hybrid EMs
Hybridization
sp
3
hybridization
sp
2
hybridization
Hydrocarbon (HC)
Hydrocarbon (HC) & carbon contamination of EM specimens
Hydrofluoric acid (HF) etching
Hydrogen (H & H
2
)
EELS Measurements of hydrogen (H)
HCl
Hydrogen bonding-type substances
Hydrogenic model for electron excitation modeling
Hysteresis
Ferroelectric dielectric hysteresis & hysteresis loop
Hysteresis factor in electron microscopes
Hysteresis removal in electron microscopes