Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
|
Appendix
Chapter J
Jahn–Teller effect
JCPDS cards for XRD analysis
JEOL TEMs
JEM-ARM 200F TEM
JEOL JEM-2010F TEM
Job positions and salary for electron microscopists
Joint density of states (JDOS)
Junctions
Passive voltage contrast (PVC) of pn-junction structures/diodes
Junction shorts in ICs
Jump & drift of EEL spectra or images
Jump ratio in EELS measurement