Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
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Appendix
Chapter K
K edges
K-edge of 3d transition elements in EELS
k-factor correction due to sample thickness effect (x-ray absorption)
k-factors in EDS/x-rays
k-space
K-shell binding energy
K-family (K
α
& K
β
) X-ray emission
K-shell ionization cross section
Kalium (K)
Kalium contamination in IC devices
Kernel size in NSS EDS analysis
(Filter) kernels in image processing
Kikuchi lines & bands in electron diffraction
Indexing Kikuchi lines
Si Kikuchi pattern
Kikuchi diffraction pattern from Si [103] zone axis
Evaluation of grain orientation based on Kikuchi lines/bands
Energy filter applied to observation of Kikuchi lines and bands
Backscattered Kikuchi diffraction (BKD)
Kikuchi lines & bands in EBSD
Kikuchi pattern contrast of EBSD depending on amorphous layer on surface
CBED Kikuchi pattern contrast depending on samples thickness
Overall electron diffraction and Kikuchi lines depending on TEM sample thickness
Alignment of zone axis following Kikuchi lines by tilting EM samples
Visibility of Kikuchi lines
Killer particles causing IC failure
Kinematically diffracted electron and X-ray beams & their intensities
Two-beam kinematic electron scattering/diffraction
Kinematic & quasi-kinematic scattering of electrons
Kinematical effects of PED (precession electron diffraction)
Kinematically forbidden reflections in electron diffraction patterns
Kinetic energy of particles (e.g. ions and electrons)
Relation of kinetic energies of secondary electrons in vacuum and specimen
Kinetic energy of electrons after passing specimen in TEM
Measurement of kinetic energy of electrons
Spread of the kinetic electron energy
Kinetic energy of secondary electron
Knock-on damage in EM measurements
Energy transfer for atomic displacement/knock-on process due to electron irradiation
Knock-on threshold of chemical elements due to electron irradiation in bulk
Knock-on threshold of chemical elements due to electron irradiation at sample surface
Minimization of atom knock-on in EMs
Cross-sections of surface sputtering/knock-on induced by electron irradiation
Sputtering/knock-on of atoms from beam-exit surface of TEM sample
KOH (potassium hydroxide) etching
Kossel-Möllenstedt (K-M) fringes
Kossel lines in x-ray diffraction
Kramers–Kronig analysis
Kramers' law: intensity of bremsstrahlung X-rays
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