Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
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Appendix
Chapter L
L-family of characteristic X-ray emission
Large uniform-thickness FIB-TEM specimen preparation
Large electron source
Laue groups & centrosymmetric space groups
Laue class/Laue symmetry
Laue‘s diffraction condition
Large angle convergent beam electron diffraction (LACBED)
Dislocation detection by CBED and LACBED
Lanthanum
EELS measurement of lanthanum
EDS measurement of lanthanum
Lanthanum Titanate (LaTiO
3
)
Superlattice of SrTiO
3
and LaTiO
3
Atomic-number contrast of lanthanum ions
La
1.2
CrS
3.2
La
2
O
3
LaAlO
3
La
2
CuSnO
6
LaMnO
3
La-based metallic-glass alloys
La
2-x
Ba
x
CuO
4
LaB
6
electron guns and their microscopes
Comparison between different electron sources/guns
Larmor frequency in EMs
Laplace's equation
Lattice distortion
Lattice point/motif/basis
Lattice mismatch & misfit dislocation separation
Lattice systems
Lattice parameters of minerals
Lattice-fringe visibility and its band
Lattice-fringe visibility maps
Lattice-fringe/structural fingerprinting
Planes in lattice system of crystals
Directions in lattice system of crystals
Determination of Burgers vector of lattice defects
One-dimensional (1-D) lattice
Two-dimensional (2-D) lattice
Three-dimensional (3-D) lattice
Number of lattice points (atoms) per unit cell
Lattice type
Lattice parameters (constants/spacing): Introduction
Change of lattice parameter due to doping
TEM experimental determination of lattice parameters
d-spacings/real crystal spacings & d-Ratio
Accuracy of lattice spacing measurements by HRTEM/FFT/electron diffraction
Lattice parameter measurement of single particles
Determination of lattice parameters/strain by plasmon EELS
Lasers
Semiconducting laser diodes (LDs)
Cost of lasers and lights
Laser stimulated seebeck effect imaging (SEI)
Laser beam direct writing (LBW)
Lasers used in thermal laser stimulation
Laves structure/phase
Lead (Pb)
EDS measurement of lead (Pb)
EELS of lead
Lead magnesium niobate [Pb(Mg
m/n
Nb
n-m/n
)O
3
, PMN]
Pb
1-p
Cr
2
X
4-p
(X = S, Se)
Misfit layer chalcogenides: (AX)
1+δ
(BX
2
)
n
(A = rare earth/Sn/Pb/Sb/Bi; B = Ti/V/Cr/Nb/Ta; X = S/Se)
Pb
x
Nb
1.17
W
1.0
O
5.93+x
PbTiO
3
Lead Iodide (PbI
2
)
Lead applied in EM systems
Pb-based metallic-glass alloys
Least
Least squares
Linear least squares fitting technique
Digital-filtered least-squares peak fitting for EDS quantification
Length and location of aberration correctors
Lenses
Aplanatic lenses and aplanatic points
Gun lens in EMs
Side-entry and top-entry lens in TEM systems
Lens/real lens in EMs and FIB (Introduction)
Aperture effect/function of lens
Functions of electron lens in EMs
Relationship between lens & Fourier transformation
Lens strength in electron microscopes
Lens requirement in EMs
Superconducting lens for EMs
Lenses for fine probe/beam formation in EMs
'Mini' lens
Concave lens in electron microscopes
Ideal/perfect lenses in EMs
Stability/instability of lens currents in EMs
Projector lenses in TEMs
Intermediate/diffraction lens
Electrostatic gun lens in EMs
Copper windings of wire in electromagnetic lenses
Iron (Fe) shroud in electromagnetic lenses
Octopole and other lenses in FIB
Divergent lenses
Lens defects in EMs
Astigmatism in EMs
Chromatic aberration in EMs
Spherical aberration in EMs
Coma in EMs
Distortion of images in EMs
Lenz model for elastic and inelastic scattering distribution simulation
Lichte’s defocus
Lifetime
Lifetime of electron gun
“Lift-out” FIB-TEM specimen preparation technique
Ligand field theory
Light
Electron relaxation and light/cathodoluminescence
ZnSSe-based/GaAs heterostructures
Attenuation of light
Ultraviolet light
Visible light
Light technology
Cost of lasers and lights
Light-emitting diodes (LEDs)
Light emission efficiencies in LEDs
Light/low-atomic-number element
Contrast difference between heavy and light elements
EDS quantification of light elements
Spatial resolution of EDS on light element matrices
EDS of light elements
HRTEM analysis of light elements
Light/optical microscopes
Light microscope and Zacharias Janssen
Comparison between optical/light and electron microscopes
In situ observation in optical microscopes
Spatial resolution of light microscopes
Limit in EMs
Limitations: not all aberration correctors are useful/economic for EMs or applications
TEM contrast limit of chemical elements
Factors limiting imaging and spectroscopy in TEM
Scherzer expression/resolution/limit
Limiting radius ratio/radius ratio rule
Line annotation with and without length label on DM
Line ROI on Gatan DigitalMicrograph
Line defects
Dark-line defects
Line focus in EMs
Linear
Linear lossless dielectrics
Linear contrast transfer theory
Linear lossy dielectrics
Linear imaging conditions in TEM
Linear least squares fitting technique
Liquid
Liquid TEM and STEM stage and holder
In Situ liquid TEM/STEM analysis
Liquid-metal ion source (LMIS)
Analysis of liquids
Liquid nitrogen
Liquid nitrogen (N
2
) cooled cryostat (e.g. in EDS detectors)
Funnels used to fill cold traps with liquid nitrogen for EMs
List of notations in the book
Lithium (Li)
EELS measurement of lithium element
TEM observation of lithium (Li)
(HAADF) STEM images of lithium (Li)
Lithium drifted & intrinsic germanium EDS detectors
Comparison of various X-ray spectrometers
Lithium fluoride (LiF)
Aluminum-lithium (Al-Li) based alloys
Lithium-titanium-oxide anodes for batteries
Lithium-drifted silicon diodes & Si(Li) EDS detectors
Lithium ion batteries
Lithography
FIB lithography
Electron beam lithography (EBL)
Comparison between FIB, electron beam and laser beam techniques
Proximity effect in lithography
Live time in EDS measurements
Local oxidation of silicon (LOCOS)
Long range ordering (LRO) in materials
Longitudinal spherical aberration
Loops
Glide and dislocation loops
Ostwald ripening/coarsening of dislocation loops
Loop ROI and Curve ROI on Gatan DigitalMicrograph
Low
Electrons emitted at low & high angles from electron guns
Lower- & upper-objective polepiece in TEMs and STEMs
Low standby power devices
Low-angle annular dark field (LAADF)
Low angle elastic scattering and coherence in TEM
Low vacuum SEM
Low index planes
Low energy
EELS measurements with low-energy incident electrons
Unique phenomena occurring at low energy of incident electrons
X-ray generation due to low-energy incident electrons
Low-energy X-rays and elemental quantification
Low-loss region in EELS
Analysis of low energy loss in EFTEM and EELS
Modeling of electronic structure by low-loss EELS
Determination of band gap from low-loss spectra in EELS
Low voltage
Advantages and disadvantages of low-/high-voltage TEM and STEM
Low voltage EMs in biological applications
Optimized low voltage EMs for high performances (e.g. with C
s
correctors)
Low-voltage scanning electron microscopy (LVSEM)
Low voltage energy dispersive spectroscopy (LVEDS) or low-energy X-ray emission spectroscopy (LEXES)
Comparison of EDS measurements with low- & high-energy incident electrons
Comparison between low- and high-voltage (S)TEM measurements
Lorentz force of moving electron in magnetic field
Loss of elements in EM specimen detected by EDS
Lorentz lens/mode for TEMs
Lorentzian distribution
Luminescence
Cathodoluminescence
Electroluminescence (EL) technique
L
α
X-ray emission
L
β
X-ray emission
L
2,3
edges of EELS: white lines for 3d transition metals and their alloys
L
2,3
edges of EELS: white lines for 4d transition metals and their alloys
L
3
/L
2
ratio in analysis of white lines in EEL spectrum
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