Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
|
Appendix
Chapter N
n-contacts/n-well contacts in ICs
PVC of n-well contacts in ICs
PVC of n-contacts in p-well in ICs
PVC of p-contacts in n-well in ICs
Nabarro–Herring creep: Void formation
Nanobeam diffraction (NBD)
Probe shift in TEM system when switching between NBD and other modes
Strain measurement with nanobeam diffraction (NBD)
Comparison between CBED and SAD (selected area diffraction)
TEM/STEM holders for in-situ nano-indentation
Nanometer sized objects
EELS analysis of nanometer sized objects
Applications of plasmon mode in EELS for nanostructures
Requirements and preparation of nano-particles TEM samples
Diffraction analysis of small area or nanoparticles by TEM and XRD
Carbon supports for EM analysis
Poor signal-to-noise-ratio for EELS of nanostructures
Challenges of TEM analysis on nanoparticles
Lattice-fringe/structural fingerprinting
Structural properties of nanomaterials
Lattice parameter measurement of single particles
XRD analysis of particles and nanostructures
Precession electron diffraction applications on nanostructures
Energy level diagrams for single atoms, dimers, clusters & bulk materials
Melting point of nano-structures
Number of atoms at surface of and in nanoparticles
Electron holography study of nanoparticles
Nano-dendrites and their formation
NanoMEGAS systems
Nanoprobing technique for IC failure analysis
Nearest neighbor distances
Study of nearest neighbor distances by EXELFS
Near Edge X-Ray Absorption Fine Structure (NEXAFS)
Near infrared
Negative (anode) & positive (cathode) electrode materials for lithium batteries
Negative charging case of passive voltage contrast (PVC) in SEM
Negative spherical aberrations
Neon (Ne)
EELS measurement of neon (Ne) element
Neon (Ne) ion sputtering yield in milling
Neutron diffraction
Newton-Lorentz equation
Newton’s law in EMs
Nickel (Ni)
EELS Measurement of Nickel (Ni)
EDS analysis of nickel (Ni)
Zr
x
–Nb
y
–Cu
z
–Ni
m
–Al
n
alloys
Ni-doped Fe/nickel in iron
X-Ni phase diagrams
Ni-based metallic-glass alloys
Diffusion coefficients of elements in nickel
Ni-Yttria-stabilized zirconia (YSZ)
Ni
5
P
2
Atomic number contrast of nickel (Ni)
Nickel silicides (e.g. Ni
2
Si/NiSi/NiSi
2
)
Nickel application in microelectronics
Nickel Silicide Failure Modes in IC devices
Comparison between nickel silicides and cobalt silicides
Niobium (Nb)
EELS measurement of niobium (Nb)
EDS measurement of niobium (Nb)
Lead magnesium niobate [Pb(Mg
m/n
Nb
n-m/n
)O
3
, PMNO]
K
2
O·7Nb
2
O
5
crystals
Pb
x
Nb
1.17
W
1.0
O
5.93+x
Zr
x
–Nb
y
–Cu
z
–Ni
m
–Al
n
alloys
Misfit layer chalcogenides: (AX)
1+δ
(BX
2
)
n
(A = rare earth/Sn/Pb/Sb/Bi; B = Ti/V/Cr/Nb/Ta; X = S/Se)
Niobium tungsten oxides
NaNbO
3
Niobium oxides
Atomic number contrast of niobium (Nb)
Nb-based metallic-glass alloys
Nitrogen (N)
EELS of nitrogen (N)
EDS measurement of nitrogen
Atomic-number contrast of nitrogen ions
Liquid nitrogen
X-N phase diagrams
Nitride semiconductors
AlN
GaN
InN
Silicon nitride (Si
3
N
4
)
TaSiN
x
Oxynitride
Nitrides
Cu/TiN/TiSi
2
/Si Contacts
Nitrogen atmosphere for annealing for semiconductors
Copper (Cu) with dielectric diffusion barrier SiC
x
N
y
Compound semiconductor
Silicon/nitrogen implantation application to suppress IC failure
Nitrogen solubility in materials
Nitrogen and its application in EMs
NH
3
Boron nitride (BN)
NiFe
Nobel Prize awarded in the fields of TEM and materials
Noble Gases
Noble gases in periodic table
Node (in ICs)
Noise
Dark current noise
Noise in STEM imaging
Noise intensity of diffractograms
Signal-to-Noise Ratio (SNR) in the EELS Spectrum
Electron beam current noise in EMs
Poor signal-to-noise-ratio for EELS of nanostructures
Electronic noise in TEM/STEM/SEM/EELS/EDS systems
Noise peaks in EDS measurement
Streaking/noise artifact in TEM/STEM images
Noise reduction
Artifact reduction in EM image recording
Noise reduction by binning in CCD
Mean filters for noise reduction
Deconvolution for noise reduction in EEL spectra
Non-centrosymmetric space groups
Nondestructive: Visual inspection for destructive and/or nondestructive analysis of IC devices
Non-linear lossless dielectrics
Non-linear lossy dielectrics
Non visible defects: Identification of soft failure and non visible defects in ICs
Non-isochromaticity of energy filter
Iso-chromatic imaging in EFTEM
Non-linear components of TEM image intensity
Nonmetals in periodic table
Notation list in the book
Notation for crystal structures
Crystallographic point group notations/description
Crystallographic space group notations/description
Hermann-Mauguin/international notations for symmetry elements
Nonvolatile
Nonvolatile electrical memory devices
NSS EDS software
Kernel size in NSS EDS analysis
Nucleation
Nucleation rate
Nuclei
Interaction between incident electron beam and atomic nuclei
Number
Number of electrons in electron beam in EMs
Number of diffraction spots formed on screen/detector in TEM
Number of valence electrons involved in plasmon scattering
Number of lattice points (atoms) per unit cell
Numerical aperture
Nyquist frequency/Nyquist limit
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