Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
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C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
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P
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Q
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R
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S
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T
|
U
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V
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W
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X
|
Y
|
Z
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Appendix
Chapter O
O-rings in EMs
Object wave function/exit plane wave function from TEM specimen
Effect of objective lens on object wave function
Objective apertures
Objective apertures in TEMs & STEMs
Optimal objective/Scherzer apertures in CTEM & HRTEM imaging
Dependence of collection angle on objective aperture in TEM imaging mode
Probe-forming/objective aperture for STEM imaging
Virtual objective aperture (VOA) in SEM
Virtual objective aperture (VOA) in TEM/STEM
Optimal size of virtual objective apertures in STEM and SEM
Objective lens
Imperfections in objective lenses
'Mini' lens
Alignment of objective lens axis
Beam alignment between condenser and objective lenses
Objective stigmator/astigmatism correction
Front focal plane of objective lens
Object plane (sample plane) of objective lens
Chromatic aberration of objective lens
Objective lens in SEMs/STEMs
Objective lens control system in SEMs
Pinhole lens as objective lens in SEMs
Symmetric immersion lens as objective lens in SEMs
Snorkel objective lens in SEMs
Objective lens in TEMs/STEMs
Benefit of low spherical aberration of objective lens
Astigmatism corrections of condenser and objective lenses in TEM for magnetic materials
Objective lens iris
Objective polepiece
Upper- & lower- objective polepiece in TEMs and STEMs
Back focal plane of objective lens in EMs
Objective lens versus EDS and EELS
Objective pre-field lens
Effect of objective lens on object wave function
Coupling between aberration corrector and objective lens
Threefold astigmatism of objective lens in TEM
Phase shift of electrons induced by objective lens
Objective prefield lens:
[1]
Post-fields of objective lens
Pole piece gaps in EM systems
Occupied states
Octagonal quasicrystal
Octahedral (O
h
) lattice
Transition metal: TMO
6
octahedral lattice
Octupole
Octupole design for C
s
corrector in EMs
Octupole lens application in GIF system
Quadrupole-octupole corrector for C
s
corrections
Quadrupole/octupole used for coupling between different lenses in EMs
Power supplies for quadrupole/octupole aberration correctors
Octopole and other lenses in FIB
Off-axis aberrations in EMs
Off-axis electron holography
Aberration correction using off-axis electron holography technique
Plane wave and interference pattern in electron holography
Measurement of electric field/dopant/p-n junction using off-axis electron holography
Measurement of magnetic field using off-axis electron holography
Spatial coherence/incoherence in EMs
Fiber in Möllenstedt–Düker biprisms for off-axis electron holography
Reconstruction of off-axis holograms
Interference width in off-axis hologram
Artifacts in off-axis electron holograms: distortions
Voltage at biprism filament in off-axis electron holography
Offset
Conduction band offset
High tension offset for image filtering for elemental analysis
Drift tube offset
EELS energy offset
One-dimensional (1-D) lattice
Omega filter
Oil-diffusion Pump
Operations of electron microscopes
Operation of aberration correctors in EMs
Operation of EDS
Operation of EELS
Bias correction of EELS/GIF
Temperature of EELS/GIF detector
Optimal electron microscopy (EM) conditions
Optimal convergence semi-angle in STEM
Optimal objective aperture for CTEM & HRTEM imaging
Optimization of camera length for various measurements
Optimal objective/Scherzer apertures in CTEM & HRTEM imaging
Optimizing EELS acquisition
Optimal size of virtual objective apertures in STEM and SEM
Effects of entrance aperture/collection angle on EELS and optimization
Optimization of EDS measurements
Operation of TEM system
ACD (anti-contamination device) operation on TEM system
Focusing action of lens
Optical properties of materials
Optical and electronic interband transitions
Optical/light microscopes
Comparison between VEELS and conventional optical spectroscopy
Optical imaging sensor
Electronic optical imaging sensor
Optical storage
Phase change optical storage media
Rewritable phase-change optical memory disks
Optics
Gaussian optics in EMs
Curved optics in EMs
Optics in electron and ion microscopes
Detailed optics of condenser lens in TEMs/STEMs
Comparison of electron optics of various filters & spectrometers
Optical axis of microscopes
X-ray optics
Grazing incidence optics
Orbit
Crystallographic orbit
Ordering
Chemical ordering in crystals
Short range ordering (SRO) in materials
Medium range ordering (MRO) in materials
Long range ordering (LRO) in materials
Elemental-ordering-induced diffuse streaks in electron diffraction patterns
Order–disorder ferroelectrics
Orientation
Determination of crystal orientation
Orientation relationship between two crystals/grains
Ostwald ripening/coarsening of dislocation loops
Orthorhombic lattices
HRTEM imags of orthorhombic crystalline structures
Base-centered orthorhombic structure
Face-centered orthorhombic structure
Body-centered orthorhombic structures
Determination of point groups of orthorhombic systems
mm2 point group
mmm point group
222 point group
Comparison between hexagonal and tetragonal (or orthorhombic) cells
Orthorhombic space groups
A-centered lattices/A-centering & its space groups
Amm2 (38)
Abm2 (39)
Ama2 (40)
Aba2 (41)
A2
1
am (Cmc2
1
, 36)
C-centered lattices/C-centering & their space groups
C222
1
(20)
C222 (21)
Cmm2 (35)
Cmc2
1
(A2
1
am, 36)
Ccc2 (37)
Cmcm (63)
Cmca (Abma, Bmab, 64)
Cmmm (65)
Cccm (66)
Cmma (67)
Ccca (68)
F-centered lattices/F-centering & their space groups
F222 (22)
Fmm2 (42)
Fdd2 (43)
Fmmm (69)
Fddd (70)
I (body-centered) lattices/I-centering & their space groups
I222 (23)
I2
1
2
1
2
1
(24)
Imm2 (44)
Iba2 (45)
Ima2 (46)
Immm (71)
Ibam (72)
Ibca (73)
Imma (74)
P (primitive) lattices & their space groups
P222 (16)
P222
1
(17)
P2
1
2
1
2 (18)
P2
1
2
1
2
1
(19)
Pmm2 (25)
Pmc2
1
(26)
Pcc2 (27)
Pma2 (Pbm2, 28)
Pca2
1
(Pbc2
1
, P2
1
ab, 29)
Pnc2 (30)
Pmn2
1
(31)
Pba2 (32)
Pna2
1
(P2
1
cn, 33)
Pnn2 (34)
Pmmm (47)
Pnnn (48)
Pccm (49)
Pban (50)
Pmma (51)
Pnna (52)
Pmna (53)
Pcca (54)
Pbam (55)
Pccn (56)
Pbcm (57)
Pnnm (58)
Pmmn (59)
Pbcn (60)
Pbca (61)
Pnma/Pbnm (62)
Osmium (Os)
EDS measurements of osmium (Os)
Outer-/Outermost-shell electrons (electrons in valence- and conduction-bands)
Oval annotation on Gatan DigitalMicrograph
Oval ROI on Gatan DigitalMicrograph
Overetch
Via overetch detected by IR-OBIRCH
Overfocus
Defocus/overfocus/underfocus in Ronchigrams
Overlap
Bond overlap population diagram (BOPD)
Energy peak overlapping in EDS spectrum
Signal overlapping in EELS
Oxidation states (oxidation number, degree of oxidation) in periodic table
Analysis of valence states by white-lines in EELS
Overvoltage Ratio in EDS Measurements
X-ray intensity affected by overvoltage
Spatial resolution dependence on overvoltages
Oxygen (O)
EDS measurement of oxygen
EELS measurements of oxygen (O)
STEM imaging of oxygen
Specimen oxidation during EM measurements
X-O phase diagram
Oxygen vacancy migration induced by voltage
O
2-
coordination and bond strength
Atomic-number contrast of oxygen ions
Cleaning of hydrocarbon contamination by oxygen radicals in EMs
Stability of ferroelectrics related to oxygen vacancies
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