Table of Contents/Index
Chapter/Index:
Introduction
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A
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B
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C
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D
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E
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F
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G
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H
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I
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J
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K
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L
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M
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N
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O
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P
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Q
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R
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S
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T
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U
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V
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W
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X
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Y
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Z
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Appendix
Chapter U
Ultra
Ultrathin TEM specimen prepared by FIB milling
Ultrathin specimen preparation by low-energy Ar-ion milling
Ultrathin window (UTW) on EDS detector
Ultrastructure
Ultraviolet light
Vacuum levels and UHV (ultra-high vacuum) in EMs
Pumps for high and ultra-high vacuums
Ultrahigh voltage TEMs
Unequivocal space groups
Unoccupied density of states
Unoccupied energy levels in conduction band (EELS)
Underfocus in EMs
TEM contrast and underfocus
Underfocusing objective lens in TEMs
Defocus/overfocus/underfocus in Ronchigrams
Unit conversion, and chemical and physical constants
Unit cells in crystals
(Space group)
High resolution TEM imaging dependence on unit cell size
Temperature dependence of unit cell volume in crystals
Determination of primitive unit cell by electron diffraction
Volume of unit cells
Number of lattice points (atoms) per unit cell
Asymmetric units in unit cells
Unknown
Determination of unknown crystal structures
Uranium (U)
EDS measurement of uranium (U)
Usable/Useful
Maximum usable illumination angle in STEM
Not all aberration correctors are useful/economic for EMs or applications (limitations)
Useful energy range in EELS measurements
Upper- & lower- objective polepiece in TEMs/STEMs
User training for EM operations
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