Practical Electron Microscopy and Database

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Chapter W

Water cooling in EMs		Water (H₂O) ice in EM measurements
Wave properties of charged particles
	Wave aberration function		Influence of diffraction on quantum wave of charged particles
	Wave-particle duality
Wave vector
	Wave vector of incident electron		Scattering vector/transferred wave vector after electron scattering with matter
	Wave vector of scattered electron in TEM
Wavefunction: Electron wavefunction
	Plane wave of electron beam		Plane wave and interference pattern in electron holography
	Wavefunction in defocusing plane in TEM imaging		Wavefunction affected by aberrations in CTEM
	Wavefunction affected by aberrations in STEM		Exit plane/object wave function from TEM specimen
	Electron wavefunction in image plane in real space and reciprocal space		Wave function of focused probe in STEM/SEM
	Exit wavefunction & intensity from STEM specimen

"Waveguide" effect in EMs
Wavelength
	Wavelength/electron velocity/high voltage		Wavelength of lights
	Wavelength (energy) of X-ray "particles" (photons)
Wavelength dispersive X-ray spectroscopy (WDXRF/WDS)
	Comparison of various X-ray spectrometers
Weak
	Weak-phase-objects (WPO) in TEM & weak phase object approximation (WPOA)		Weak scattering in some materials in TEM observations
	TEM sample thickness satisfying weak phase criterion		Weak phase object methods in image series reconstruction with TEM
	Extinctions and weak spots showing in electron diffraction patterns of diamond, silicon, germanium, and Tin (Sn)		Energy filter applied to observation of weak reflections in electron diffractions
	Weak spots related to superstructures in electron diffractions		Pseudo-weak phase-object approximation
	Weak-beam (WB) technique in TEM

World Wide Web (website) & Internet for electron microscope and materials		Wedge mask annotation on Gatan DigitalMicrograph
Wedge-shaped structures
	EDS artifact of wedge-shaped TEM specimen		Applications of wedge-shaped TEM specimen in EM analysis
	Wedge polishing method for TEM specimen preparation		Wedge FIB milling method for TEM specimen preparation

Wehnelt unit in electron source		Weiss zone law
White lines in EELS		Whole-pattern symmetry
Width
	Zero-loss peak in EELS and its broadening/width		Width of energy peaks/edges in EELS spectrum
	Widths of X-ray peaks in EDS measurement		Interference width in off-axis hologram
	Widths of dislocations
Window
	Vacuum sealed electron transparent windows for in-situ TEM		Windowless' EDS detector
	Infrared windows		X-ray absorption in detector windows

Wien filter		WIEN2k
Wiener filter method for image series reconstruction with TEM		Wigner-Seitz cell

	Copper windings of wire in electromagnetic lenses
Wobblers in EMs
	Wobbler for condenser lens excitation in TEM/STEM		Wobbler for high tension (HT wobbler) in TEM/STEM
	Wobbler for coma-free alignment with beam tilt		Wobbler for pivot point/rocking point/(Shift X/Y & Tilt X/Y, purity or balance)
	Wobbler for finding Eucentric height of specimen in TEM		Anode wobbler in TEM
Working distance
	Contrast dependence on working distance in SEM		Working distance in FIB processes
Wulff net
	Angle between two planes/plane normals/poles measured by Wulff net		Aberrations versus working distance in SEMs

Wurtzite structure		Wyckoff positions