Table of Contents/Index
Chapter/Index:
Introduction
|
A
|
B
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C
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D
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E
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F
|
G
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H
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I
|
J
|
K
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L
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M
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N
|
O
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P
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Q
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R
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S
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T
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U
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V
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W
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X
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Y
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Z
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Appendix
Chapter Y
Yields
Electron emission and its coefficient under electron irradiation
SE yield (emission coefficient) in SEM
X-ray (fluorescence) yield/weight due to electron irradiation
SE yield depending on the incident angle of primary beam
SE yield depending on accelerating voltage of primary electrons
Introduction of ionic sputtering yields
Ionic sputter yield depending on grain orientation
Yield of Auger electrons
Yield of X-rays
Yields in ion milling
Argon ion sputtering yield in milling
Ionic sputtering yield in FIB
Xenon ion sputtering yield in milling
Young
Young’s experiment
Young’s fringes produced by TEM image shift (with and without monochromator)
Spatial resolution of TEM measured by Young’s fringe
Young's moduli and melting temperature
Ytterbium (Yb)
Yb
2
O
3
Yttrium (Y)
EELS measurements of yttrium (Y)
Yttrium-aluminum garnet (Ce-doped YAG)
Atomic-number contrast of yttrium ions
Y
2
O
3
Yttria-stabilized zirconia (YSZ)
Ni-Yttria-stabilized zirconia (YSZ)
Cu-CeO-YSZ
Y-based metallic-glass alloys
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