Practical Electron Microscopy and Database - An Online Book
Table of Contents/Index 
Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Chapter Y  
  Electron emission and its coefficient under electron irradiation   SE yield (emission coefficient) in SEM 
  X-ray (fluorescence) yield/weight due to electron irradiation   SE yield depending on the incident angle of primary beam
  SE yield depending on accelerating voltage of primary electrons   Introduction of ionic sputtering yields
  Ionic sputter yield depending on grain orientation    
  Yield of Auger electrons   Yield of X-rays
Yields in ion milling
  Argon ion sputtering yield in milling   Ionic sputtering yield in FIB
  Xenon ion sputtering yield in milling    
  Young’s experiment   Young’s fringes produced by TEM image shift (with and without monochromator)
  Spatial resolution of TEM measured by Young’s fringe   Young's moduli and melting temperature
Ytterbium (Yb) 
  EELS measurements of yttrium (Y)    
  Yttrium-aluminum garnet (Ce-doped YAG)     Atomic-number contrast of yttrium ions
  Y2O3   Yttria-stabilized zirconia (YSZ)
  Ni-Yttria-stabilized zirconia (YSZ)   Cu-CeO-YSZ
  Y-based metallic-glass alloys    
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