Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
[1] Morávek, T., Serralta, E., Hladík, L., Chandran, N., Němeček, D., & Stroud, R., Advancing quantitative failure analysis and strain measurements at the nanoscale by using scanning electron diffraction microscopy enhanced by beam precession. In Proceedings of the 50th International Symposium for Testing and Failure Analysis (pp. 434–439). ASM International. https://doi.org/10.31399/asm.cp.istfa2024p0434, 2024.
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