Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
JEOL TEMs
| Table 0114. JEOL TEMs.
| Feature |
JEM-120i |
JEM-2100Plus |
JEM-F200 |
JEM-ARM200F NEOARM |
JEM-ARM300F2 GRAND ARM™2 |
CRYO ARM™ 200 |
| Acceleration Voltage |
20–120 kV |
200 kV |
200 kV |
200 kV |
300 kV |
200 kV |
| Electron Source |
LaB6 |
LaB6 |
Cold Field Emission Gun |
Cold Field Emission Gun |
Cold Field Emission Gun |
Cold Field Emission Gun |
| Resolution (Point-to-Point) |
0.2 nm (High Contrast), 0.14 nm (High Resolution) |
0.14 nm |
0.16 nm |
0.078 nm |
0.05 nm |
0.1 nm |
| Special Features |
Compact design; easy operation; expandable; suitable for soft materials like biology and polymers. |
Multipurpose TEM; integration of STEM, EDS, and EELS; intuitive operation; suitable for materials science and biological studies. |
Advanced analytical capabilities; high throughput; dual Silicon Drift Detectors; suitable for a wide range of applications. |
Atomic resolution analytical electron microscope; equipped with next-generation Cs corrector; suitable for high-resolution imaging and analysis. |
World's highest resolution in a commercially available TEM; suitable for atomic-level analysis; advanced stability and performance. |
Specialized for cryo-electron microscopy; automatic acquisition of image data for single particle analysis; suitable for observing electron beam-sensitive specimens. |
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