Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Yield of Backscattering Electrons in EM

Figure 1162 shows the yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope.

Yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope

Figure 1162. Yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope.