Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Water (H2O) Ice in EM Measurements

Figure 1177 shows the percentage of x-ray transmitted through an H2O-ice contamination layer depending on the thickness of the H2O-ice layer up to 1 μm. As expected, the absorption effect of ice layer is greatest for the low-energy boron x-rays and the least for the silicon signal. Such H2O-ice layer is normally formed in cryo-TEM measurements.

Calculated percentage absorption of characteristic x- rays in an H2O-ice contamination layer

Figure 1177. Calculated percentage absorption of characteristic x- rays in an H2O-ice contamination layer. [1]. X-ray energies: B-K = 183 eV, C-K = 277 eV, O-K = 525 eV, N-K = 392 eV and Si-K = 1.739 keV.

 

 

 

 

 

 

 

 

 


         

 

 

 

 

 

 

 


[1] M. Malac and R.F. Egerton, Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine, Microsc. Microanal. 5, 29–38, (1999).

 

 

 

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