EDS Measurements of Minor and/or Trace Elements - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book http://www.globalsino.com/EM/ | |||||
When minor and/or trace elements are of interest, a high deadtime, e.g. 30–40%, should still be used to record the spectrum regardless of the artifacts such as escape peaks, pulse pileup and peak distortion at high deadtime. |
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