Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
EELS Measurements of Yttrium (Y)
| Examples of EELS studies in Y-containing materials are:
- Yttrium-Based Superconductors: One common application of EELS is in the study of high-temperature superconductors, particularly Yttrium Barium Copper Oxide (YBCO). EELS can be used to investigate the oxidation states, electronic properties, and local structure of Y, Ba, and Cu within these materials. Researchers often use EELS to understand the relationship between the electronic structure and the superconducting properties of YBCO.
- Yttria-Stabilized Zirconia (YSZ): YSZ is widely used as a solid electrolyte in fuel cells. EELS can be employed to analyze the Y L-edge and the oxygen K-edge, helping researchers understand the role of Y in stabilizing the zirconia structure and its effects on ionic conductivity.
- Y doped materials: In various other materials, Y might be used as dopants. EELS can be utilized to study the distribution and local environment of these dopants, offering insights into how they affect the material's overall properties.
The
typical Y observations in EELS are:
- Yttrium (Y): Yttrium's L-edge is commonly analyzed in EELS. It provides information about the oxidation state and coordination of Y in the material.
Yttrium (Y) EELS edges are:
- L-edge:
- Y L3-edge: ~2080 eV
- Y L2-edge: ~2165 eV
- The L-edge in Y is due to the excitation of 2p electrons to unoccupied states above the Fermi level. The L3 and L2 edges correspond to the transitions from 2p3/2 and 2p1/2, respectively.
- M-edge:
- Y M4,5-edge: ~150 eV to 200 eV
- The M-edge involves the excitation of 3d electrons. The M4 and M5 edges arise from the transitions of 3d3/2 and 3d5/2 electrons, respectively.
Table 1388a lists the main edges of Y used in EELS analysis. The features of the Y M4,5 edges are complicated due to the 3d → 4f transitions.
Table 1388a. Main edges of Y used in EELS analysis.
Edge(s) |
Edge onsets (eV) |
| M4,5 |
158 |
| L2,3 |
2041 |
In order to record the signals of Y together with other elements in a single EEL spectrum, a proper edge of Y should be selected. For instance, Table 1388b lists some application examples of Y edges used in the particular cases.
| Table 1388b. Application examples of the Y edges used in particular cases. |
Materials |
Analyzing elements |
Y-edge (eV) |
Other elements and their edge(eV) |
| SiY alloy |
Si, Y |
M4,5 |
Si L: 99 |
|
