EELS Measurements of Yttrium (Y) - Practical Electron Microscopy and Database - - An Online Book - |
||||||||||||||||||||
Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||||||||||||||
Table 1388a lists the main edges of Y used in EELS analysis. The features of the Y M4,5 edges are complicated due to the 3d → 4f transitions. Table 1388a. Main edges of Y used in EELS analysis.
In order to record the signals of Y together with other elements in a single EEL spectrum, a proper edge of Y should be selected. For instance, Table 1388b lists some application examples of Y edges used in the particular cases.
|
|
|||||||||||||||||||