Anisotropy of Thermal Expansion Coefficients due to Defects
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The C49 TiSi2 present an anisotropic thermal expansion coefficients: the αb is considerably smaller than αa and αc because of the presence of
planar defects perpendicular to the large b-axis of the unit-cell [1].




[1] T.C. Chou, C.Y. Wong, K.N. Tu, J. Appl. Phys. 62 (1987) 2275.



The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

Copyright (C) 2006 GlobalSino, All Rights Reserved