Energy Resolutions of Different Spectroscopic Techniques
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The energy resolution of EELS measurements can be limited by both the aberrations of spectrometers and the energy spread of incident electron beams.

Comparing with EELS method, some techniques have higher energy resolutions. For instance, synchrotron X-ray sources and beam-line spectrometers can provide a resolution below 0.15 eV for absorption spectroscopy, and even below 1 meV in some cases.




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