Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Rocking-curve Intensity Oscillations within CBED

The variation in s causes intensity oscillation across the disk. For instance, the intensity of a diffracted beam, Ig(s), is the function of an effective deviation parameter, seff:

          intensity of a diffracted beam ---------------------------- [1990a]

where ξg is the extinction distance for the diffraction g. seff is given by,
          intensity of a diffracted beam ---------------------------- [1990b]

Figure 1990 shows the calculated intensity profile of Ig as a function of s and 2θB (the separation of the (000)- and (hkl)-disks). The profile in Figure 1990 (a) is also called rocking curve.

The separation (2θB) of the (000)- and (hkl)-discs under two-beam conditions

Figure 1990. (a) The calculated intensity profile of Ig as a function of s (equals to an intensity trace taken across the g disk), and (b) The separation (2θB) of the (000)- and (hkl)-discs under two-beam conditions.