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Ronchigram Depending on Accelerating Voltage of Electron Beam
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The Ronchigrams in STEMs operated at lower accelerating voltages have smaller semi-angles than those operated at higher accelerating voltages. These smaller semi-angles represent smaller flat-contrast areas where the probe coherently converges on specimens in STEMs.
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The book author (Y. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Y. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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