- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Table 2391. Comparison of properties of crystalline and amorphous SiSn materials.

Crystalline SiSn
Amorphous SiSn
Energy gap/Optical band gap Eg (eV)
1.50 for a-Si1-xSnx:H
Urbach energy E0 (meV)
60 for a-Si1-xSnx:H
Fermi level density of states g (EF) (cm-3eV-1)
1017 for a-Si1-xSnx:H





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