Electron Traps in Electron Microscopy (EM)-related System
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In many cases, electron traps are used to protect the EDS detectors in EMs as shown in Figure 2523. High-energy electrons can strike and penetrate into EDS detectors if windowless or ultra thin window detectors are used. Therefore, it is necessary to employ an electron trap to protect the detector from the scattering of the high-energy electrons. The electron traps are normally equipped with permanent magnets that divert the electrons from their course. Note if the geometric configuration of the detector together with the specimen and electron beam is not correct (e.g. an incorrect working distance is used), the electron trap cannot function properly.

Schematic illustration of an SEM equipped with an electron trap in EDS system

Figure 2523. Schematic illustration of a SEM equipped with an electron trap in EDS system.




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