Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| Spherical aberration correction in EMs can induce a probe-current-density increase by a factor of 4 to 9. Not only will this enhance the signal-to-noise ratio of STEM images but also the signals for analytical electron microscopy, for instance, energy-dispersive X-ray spectroscopy (EDX) and electron energy-loss spectroscopy (EELS).
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