Zero Loss Extraction in EELS Analysis
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

 

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The area under the zero-loss peak can be given by,
               I0 = I·exp(-t/λ) ----------------------- [2636]
where,
          I -- the probe current,
          t -- the sample thickness,
          λ -- the mean-free path for plasmon excitation.   

Figure 2636 shows the EELS zero loss extraction using a power-law background model, giving a raw valence band spectrum and residual spectrum following subtraction of a power-law background model. The green arrow indicates a typical, artificially induced false feature, located in the energy region of 2-3 eV. This artifact can easily occur and is most likely induced by the incorrectly focused ZLP as during EELS alignment process the ZLP is normally optimized by only focusing the peak to maximize the intensity and less attention is paid to the low intensity tails.

EELS  zero loss extraction using a power-law background model

Figure 2636. EELS zero loss extraction using a power-law background model.

 

 

 

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