EELS Resolution Affected by Asymmetry of Zero-Loss Peak
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The energy resolution of EELS is normally affected by the asymmetry of zero-loss peak. The high-resolution edges can be obtained by deconvoluting the effects of the asymmetry of the zero-loss peak and the point-spread function [1].




[1] R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, Plenum, New York, 1986.



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