EELS Measurement in Diffraction Mode
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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EELS measurement can be done in electron diffraction mode in TEM. In this mode, the beam illumination area can be very large if the material non-uniformity is not an issue. Therefore, carbon contamination and beam damage can be minimized because when the beam is enlarged the beam current density can be very small.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.