Off-axis Aberrations in EMs
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The off-axis aberrations are negligible in the case of high-resolution TEM imaging and STEM [1].




[1] S. Uhlemann, M. Haider, Ultramicroscopy 72 (1998) 109.



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