This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

Figure 2772 shows the full view of of the practical double-sextupole C_s correctors for STEM and for TEM, respectively. The positions of the correctors with respect to the pre- and post-fields of objective lenses for STEM and TEM, respectively, are also indicated.

Due to the significant energy spread in the electron beam, the chromatic aberration associated with the lenses will lead to image degradation in TEM as listed in Table 2772.

Table 2772. Causes of energy spreads and the image degradation induced by the associated lenses.