TEM Modeling
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Numerical simulations modeling TEM (transmission electron microscopy) and STEM images have mainly been traditionally performed using the two methods:
        i) Multislice,
        ii) Bloch wave approaches.

Both models can be employed to calculate the exit-surface elastic wave function.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.