- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


It was also proposed [1] that lock-in IR-OBIRCH can improve signal noise ratio (SNR) by employing a laser that is modulated by frequencies of 5 KHz or 50 KHz. Figure 2842 shows the schematic illustration of a lock-in IR-OBIRCH system.

Schematic illustration of a lock-in IR-OBIRCH system

Figure 2842. Schematic illustration of a lock-in IR-OBIRCH system. [1]







[1] Chunlei Wu, Li Tian, Miao Wu, Diwei Fan, Lock-in IR-OBIRCH Assisted with Current Detection Probe Head Extend Its Application to High Voltage High Current Failure Analysis, 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (2012).



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