This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In IR-OBIRCH measurements, the defect or high current path is sometimes not stimulated by the laser scanning (so that it is not visible) because:
        i) The weak signal is not detected by the amplifier,
        ii) The defect is covered by the metal layers so that the laser is resisted.

In many cases, the IROBIRCH images can just suggest some fragments of the whole current path; therefore, it is necessary to build a link between different parts. The analysis should be based on the knowledge of the circuits, common failure in particular fabrication lines, and some imaginations.