Leakage Current Analysis/Detection in ICs
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Due to the increasing integration, complexity, metal layers in integrated circuits (ICs), defects that induce leakage current are frequently covered by the wide and thick metal layers and thus, Failure Analysis (FA) is more challenged for locating the leakage current.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.